USNC TAG for IEC TC 113
This is the home page for the U.S. National Committee Technical Advisory Group (TAG) for International Electrotechnical Commission (IEC) Technical Committee No. 113 (TC 113), Nanotechnology standardization for electrical and electronic products and systems.
The TC 113 TAG is the vehicle by which U.S. manufacturers of nano-enabled electrotechnical products create a favorable international business model for their companies and their industry. This is because the TAG is the forum for developing standards for the characterization of nanoscale-attributes and the reliability and durability of nano-scale subassemblies.
Historically, standards have driven the commercial landscape and have accelerated the commercialization and mass production of new technologies. Nanotechnology for the electrical and electronic sectors will be no different. The U.S. has the largest nanotechnology manufacturing base in the world. This presents us with countless opportunities for breakthroughs from industry and the scientific community that will lead to safer and more functional products, including renewable sources of electricity for home and transportation needs, flexible video displays, and compact electronic devices. But if we aren’t proactive in standardization work for this emerging field, other countries and regions around the world will prevail in setting those standards for us and put us at a competitive disadvantage as mass production expands. Nanomaterial suppliers and product development experts in nano-electrotechnical measurements and performance assessments are urged to join the TC 113 TAG and help the U.S. lead in this vital work.
Membership is open to all U.S. stakeholders in nanotechnology, but requires application through the TAG Secretary and Technical Advisor, and approval by the TAG membership. TAG activities are governed by its approved Operating Procedures.
TAG members: Click here for the members-only pages.
Technical Advisor - Dr. Brent Segal
TAG Secretary - Mike Leibowitz
Scope of TC 113
Standardization of the technologies relevant to electrical and electronic products and systems in nanotechnology, in close cooperation with other committees of the IEC and ISO TC 229.
Click here to learn about IEC TC 113, including officers, member countries and the Committee's Strategic Policy Statement.
Structure of TC 113
TC 113 is composed of the following:
IEC TC 113-ISO TC 229 Joint Working Group 1 (JWG1), Terminology
IEC TC 113-ISO TC 229 Joint Working Group 2 (JWG2), Measurement and instrumentation
IEC TC 113 Working Group 3 (WG3), Performance assessment
WG3 Task Group 1, TC 113 Standardization roadmap
WG3 Task Group 2, IEC Technical Report for nanoscale contacts
Click here to view a presentation on the TC 113 structure and work program made by TC 113 Chairman Dr. J. Thomas Chapin before the IEC Standardization Management Board at its February 12, 2008 meeting in Geneva. Use normal view to see the explanatory notes for each slide.
TC 113 Program of Work
TC 113 is engaged in the following work projects:
1 - IEC TS 62565: Guideline specification for single walled carbon nanotubes for electrotechnical applications. This is in the Committee Draft stage
2 - IEC/ISO TS 62607, Technical Specification for the Electrical Characterization of Carbon Nanotubes Using 4-probe Measurement. This is in the working draft stage.
3 - IEC/IEEE 62624, Standard Test Methods for Measurement of Electrical Properties of Carbon Nanotubes. A maintenance cycle will begin shortly.
4 - IEC/IEEE 62xxx, Large scale manufacturing of nanoelectronics. This is a new work item proposal currently under consideration within the TC 113 membership.
5 - IEC 62xxx, Technical Report on nanoscale electrical contacts
6 - IEC 62xxx, Technical Report for the TC 113 Nanoelectronics standardization roadmap
7 - Development of IEC 62607-3-1, a U.S.-led New Work Item Proposal for determining the quantum efficiency of luminescent nanoparticles, is in progress. This is in the drafting stage.
8 - ISO/IEC TS 10797, Technical Specification for Characterization of single-wall carbon nanotubes using transmission electron microscopy (TEM). This is in the working draft stage.
9 - Synergistic activity with the ANSI Accredited U.S. TAG to ISO/TC 229, Nanotechnology pertaining to JWG1 and JWG2.
10 - The TAG is exploring new work for TC 113 to address environment, health and safety (EHS). The January 24, 2008 (draft) EPA Nanomaterial Research Strategy provides an impetus for electrotechnical focus on EHS aspects of the nanomaterial life cycle.
Become a TAG member today!
Why should you become a TAG member? Because standardization drives the commercial landscape! Whoever drives standards holds the high ground on the commercialization of their products. If you don't drive, you follow!
Membership on the TC 113 TAG affords you a voice in IEC standards work, including:
- Access to the members-only pages including TC 113 working documents
- Voting rights in the formulating of U.S. National Committee positions
- The opportunity to introduce or contribute to new work proposals
- The opportunity to comment on working drafts
- Eligibility to lead in standards projects
- Representation in international working groups and plenary sessions
Contact us to join or for questions. When formally requesting membership, please complete and submit a TAG application along with your professional resume and organizational letter of support.
Events Calendar
April 14-16, 2009
IEC TC 113 WG3, PT 62565 and PT 62607, Beijing, China
April 13-17, 2009
MRS Spring Meeting in San Francisco, CA
May 3-7, 2009
NanoTech 2009, NSTI Nanotechnology Conference & Trade Show, Houston, TX
May 4, 2009
IEC TC 113 TAG, in Houston, TX in conjunction with Nanotech 2009
June 8-12, 2009
ISO TC 229 and WG meetings in Seattle, WA
July 26-20, 2009
IEEE Nano 2009 in Genoa, Italy
August 17, 2009
IEC TC 113 TAG teleconference
October 18-21, 2009
IEC TC 113 and ISO TC 229 Plenary and WG meetings in Tel Aviv, Israel in conjunction with the 2009 IEC General Meeting
November 30, 2009
IEC TC 113 TAG, in Boston, MA in conjunction with the MRS Fall 2009 meeting
April 5-9, 2010
MRS Spring 2010 meeting in San Francisco, CA
June 21-25, 2010
Nanotech 2010, NSTI Conference and Expo in Anaheim, CA
August 17-20, 2010
IEEE Nano 2010 in Kintex, Islan, Gyeonggi-Do, Korea
October 11-15, 2010
IEC TC 113 and its WG3 and PT's in Seattle, WA in conjunction with the 2010 IEC General Meeting
November 30-December 2, 2010
MRS Fall 2010 meeting in Boston, MA
October 24-28, 2011
IEC General Meeting in Melbourne, Australia
Articles, Papers and Presentations of Interest
Interview with Dr. Mike Roco, primary coordinator of the U.S. nanotechnology science, engineering, and technology effort
IEC TC 113 Nano-Electrotechnical Standardization Gains Momentum
IEC e-tech February 2008, Technology Focus: Nanotechnology standardization
Presentation: Measurements and Standards for Accelerating Innovation in Medical Imaging, by Dr. Herbert Bennett, NIST
